Adaptive sampling for coordinate metrology

An iterative sampling process for dimensional measurement is presented. The strategy is based upon the use of surface normal measurement data to develop an interpolating curve between sample points. The interpolant is used to select subsequent measurement targets iteratively. The process is repeated until the measurement converges to a complete and accurate evaluation of the surface. The required sample size is proportional to part quality. The most accurate parts will require the least sample points; whereas, lower quality parts will require a greater number of total samples. The method is particularly applicable to measurement of complex surfaces with coordinate measuring machines (CMMs). (C) 1999 Elsevier Science Inc. All rights reserved.