Two-frequency grating used in phase-measuring profilometry

被引:119
作者
Li, JL
Su, HJ
Su, XY
机构
[1] The Department of Opto-electronics, Sichuan Union University, Chengdu
关键词
phase-measuring profilometry; phase unwrapping; two-frequency grating;
D O I
10.1364/AO.36.000277
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a method that uses two groups of fringe patterns on one grating for phase-measuring profilometry. A two-frequency grating is projected onto the object. The high frequency is N (N = 3, 4, 5,...) times greater than the low frequency. Using a proper phase shift, we calculated the wrapped phases of the two frequencies. When the linearity of the two phases are considered, an accurate phase of the high frequency can be unwrapped. Because the low frequency is N times more insensitive to height discontinuity, the system is more tolerable to height discontinuity. (C) 1997 Optical Society of America
引用
收藏
页码:277 / 280
页数:4
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