Serial bideposition of anisotropic thin films with enhanced linear birefringence

被引:135
作者
Hodgkinson, I [1 ]
Wu, QH [1 ]
机构
[1] Univ Otago, Dept Phys, Dunedin, New Zealand
关键词
D O I
10.1364/AO.38.003621
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe a serial bideposition technique in which a tilted substrate is rotated stepwise by half a turn about a normal axis during the evaporation of a metal oxide from a single electron-beam source. Coatings formed by the new method develop a columnar nanostructure that is perpendicular to the substrate and has greatest width or bunching perpendicular to the common deposition plane. With appropriate choice of deposition parameters, the method produces biaxial films with large birefringence, principal axes aligned parallel and perpendicular to the substrate, and improved uniformity. Measured phase retardances for light incident normally on the films are double the corresponding values for tilted-columnar films. (C) 1999 Optical Society of America.
引用
收藏
页码:3621 / 3625
页数:5
相关论文
共 17 条
  • [1] ANISOTROPY IN THIN-FILMS - MODELING AND MEASUREMENT OF GUIDED AND NONGUIDED OPTICAL-PROPERTIES - APPLICATION TO TIO2 FILMS
    FLORY, F
    ENDELEMA, D
    PELLETIER, E
    HODGKINSON, I
    [J]. APPLIED OPTICS, 1993, 32 (28): : 5649 - 5659
  • [2] Empirical equations for the principal refractive indices and column angle of obliquely deposited films of tantalum oxide, titanium oxide, and zirconium oxide
    Hodgkinson, I
    Wu, QH
    Hazel, J
    [J]. APPLIED OPTICS, 1998, 37 (13): : 2653 - 2659
  • [3] Hodgkinson I.J., 1998, OSA TECHNICAL DIGEST, V9, P104
  • [4] MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE
    HODGKINSON, IJ
    HOROWITZ, F
    MACLEOD, HA
    SIKKENS, M
    WHARTON, JJ
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (10): : 1693 - 1697
  • [5] ENVELOPE AND WAVE-GUIDE METHODS - A COMPARATIVE-STUDY OF PBF2 AND CEO2 BIREFRINGENT FILMS
    HOROWITZ, F
    MENDES, SB
    [J]. APPLIED OPTICS, 1994, 33 (13): : 2659 - 2663
  • [6] HOROWITZ F, 1988, 1988 OSA TECHNICAL D, V6, P203
  • [7] Janchen H., 1996, Pure and Applied Optics, V5, P405, DOI 10.1088/0963-9659/5/4/007
  • [8] REFLECTION AT THE MOTOHIRO-TAGA INTERFACE OF 2 ANISOTROPIC MATERIALS WITH COLUMNAR MICROSTRUCTURES
    LAKHTAKIA, A
    MESSIER, R
    [J]. OPTICAL ENGINEERING, 1994, 33 (08) : 2529 - 2534
  • [9] THIN-FILM RETARDATION PLATE BY OBLIQUE DEPOSITION
    MOTOHIRO, T
    TAGA, Y
    [J]. APPLIED OPTICS, 1989, 28 (13): : 2466 - 2482
  • [10] Motohiro T, 1996, P SOC PHOTO-OPT INS, V2873, P214, DOI 10.1117/12.246223