MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE

被引：48

作者：

HODGKINSON, IJ

HOROWITZ, F

MACLEOD, HA

SIKKENS, M

WHARTON, JJ

机构：

[1] UNIV FED RIO GRANDE SUL,INST FIS,BR-90000 PORTO ALEGRE,RS,BRAZIL

[2] UNIV GRONINGEN,DEPT APPL PHYS,9747 A6 GRONINGEN,NETHERLANDS

[3] USAF,WRIGHT AERONAUT LABS,AIR FORCE INST TECHNOL,ENP,WRIGHT PATTERSON AFB,OH 45433

[4] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1985年 / 2卷 / 10期

关键词：

D O I：

10.1364/JOSAA.2.001693

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1693 / 1697

页数：5

共 14 条

[1] OPTICS IN STRATIFIED AND ANISOTROPIC MEDIA - 4X4-MATRIX FORMULATION
BERREMAN, DW
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1972, 62 (04) : 502 - &
[2] Born M., 1959, PRINCIPLES OPTICS
[3] THIN-FILMS FIELD-TRANSFER MATRIX-THEORY OF PLANAR MULTILAYER WAVEGUIDES AND REFLECTION FROM PRISM-LOADED WAVEGUIDES
CHILWELL, J
HODGKINSON, I
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1984, 1 (07): : 742 - 753
[4] COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS
DIRKS, AG
LEAMY, HJ
[J]. THIN SOLID FILMS, 1977, 47 (03) : 219 - 233
[5] HODGKINSON IJ, 1984, TOPICAL M OPTICAL IN
[6] ELECTROMAGNETIC WAVE PROPAGATION IN BIREFRINGENT MULTILAYERS
HOLMES, DA
FEUCHT, DL
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (12) : 1763 - &
[7] A COMPARISON OF THIN-FILM MEASUREMENT BY GUIDED-WAVES, ELLIPSOMETRY AND REFLECTOMETRY
KING, RJ
TALIM, SP
[J]. OPTICA ACTA, 1981, 28 (08): : 1107 - 1123
[8] Klein M. V., 1970, OPTICS
[9] LEE CC, 1983, J OPT SOC AM, V73, P1871
[10] 4 X 4 MATRIX FORMALISMS FOR OPTICS IN STRATIFIED ANISOTROPIC MEDIA
LINCHUNG, PJ
TEITLER, S
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1984, 1 (07): : 703 - 705