Influence of light intensity on the photoluminescence of silicon nanostructures

被引:21
作者
Amans, D [1 ]
Guillois, O [1 ]
Ledoux, G [1 ]
Porterat, D [1 ]
Reynaud, C [1 ]
机构
[1] CEA Saclay, Serv Photons Atom & Mol, F-91191 Gif Sur Yvette, France
关键词
D O I
10.1063/1.1461064
中图分类号
O59 [应用物理学];
学科分类号
摘要
The strong visible photoluminescence (PL) of nanostructured silicon, such as porous Silicon and silicon nanocrystals, is studied as a function of the power and the wavelength of the excitation laser source. The position of the PL peak is a function of the fluence: when the incident fluence is increased, the PL peak is blueshifted, and it is redshifted to its initial position when the fluence is decreased back. The PL yield is strongly attenuated with the increasing fluence and this decrease is partially irreversible. The behavior is also found to be a function of the wavelength of excitation: the shorter the excitation wavelength, the stronger the fluence effect. The PL temporal behavior has also been studied and appears to be weakly sensitive to the fluence. Fluence effects are compared to temperature effects and both are noticeably different, proving the absence of heating effects in our experiment for a wide range of incident power. Auger effect and state filling are discussed in order to understand the experimental results in the framework of the quantum confinement process. (C) 2002 American Institute of Physics.
引用
收藏
页码:5334 / 5340
页数:7
相关论文
共 27 条
[1]   Evidence for a thermal contribution to emission intermittency in single CdSe/CdS core/shell nanocrystals [J].
Banin, U ;
Bruchez, M ;
Alivisatos, AP ;
Ha, T ;
Weiss, S ;
Chemla, DS .
JOURNAL OF CHEMICAL PHYSICS, 1999, 110 (02) :1195-1201
[2]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[3]   LIGHT-INDUCED DEGRADATION ON POROUS SILICON [J].
CHANG, IM ;
PAN, SC ;
CHEN, YF .
PHYSICAL REVIEW B, 1993, 48 (12) :8747-8750
[4]   LUMINESCENCE DECAY IN DISORDERED LOW-DIMENSIONAL SEMICONDUCTORS [J].
CHEN, X ;
HENDERSON, B ;
ODONNELL, KP .
APPLIED PHYSICS LETTERS, 1992, 60 (21) :2672-2674
[5]   The structural and luminescence properties of porous silicon [J].
Cullis, AG ;
Canham, LT ;
Calcott, PDJ .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (03) :909-965
[6]   THEORETICAL ASPECTS OF THE LUMINESCENCE OF POROUS SILICON [J].
DELERUE, C ;
ALLAN, G ;
LANNOO, M .
PHYSICAL REVIEW B, 1993, 48 (15) :11024-11036
[7]   AUGER AND COULOMB CHARGING EFFECTS IN SEMICONDUCTOR NANOCRYSTALLITES [J].
DELERUE, C ;
LANNOO, M ;
ALLAN, G ;
MARTIN, E ;
MIHALCESCU, I ;
VIAL, JC ;
ROMESTAIN, R ;
MULLER, F ;
BSIESY, A .
PHYSICAL REVIEW LETTERS, 1995, 75 (11) :2228-2231
[8]   LASER-DRIVEN FLOW REACTOR AS A CLUSTER BEAM SOURCE [J].
EHBRECHT, M ;
FERKEL, H ;
SMIRNOV, VV ;
STELMAKH, OM ;
ZHANG, W ;
HUISKEN, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (07) :3833-3837
[9]   Gas-phase characterization of silicon nanoclusters produced by laser pyrolysis of silane [J].
Ehbrecht, M ;
Huisken, F .
PHYSICAL REVIEW B, 1999, 59 (04) :2975-2985
[10]   Photoluminescence and resonant Raman spectra of silicon films produced by size-selected cluster beam deposition [J].
Ehbrecht, M ;
Kohn, B ;
Huisken, F ;
Laguna, MA ;
Paillard, V .
PHYSICAL REVIEW B, 1997, 56 (11) :6958-6964