Multiply charged cluster ion crossed-beam apparatus: Multi-ionization of clusters by ion impact

被引：64

作者：

Bergen, T ^{[1
]}

Biquard, X ^{[1
]}

Brenac, A ^{[1
]}

Chandezon, F ^{[1
]}

Huber, BA ^{[1
]}

Jalabert, D ^{[1
]}

Lebius, H ^{[1
]}

Maurel, M ^{[1
]}

Monnand, E ^{[1
]}

Opitz, J ^{[1
]}

Pesnelle, A ^{[1
]}

Pras, B ^{[1
]}

Ristori, C ^{[1
]}

Rocco, JC ^{[1
]}

机构：

[1] CEA Grenoble, Serv Ions Atomes & Agregats, Dept Rech Fondamentale Mat Condensee, F-38054 Grenoble 9, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 08期

关键词：

D O I：

10.1063/1.1149900

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An experimental setup is described, which is used to multi-ionize neutral clusters and to study their stability and the importance of different decay processes. Clusters are ionized in collisions with slow multiply charged ions (projectile charge z ranging from 1 to 30, kinetic energies ranging from 1 to 20 keV/charge). Both ion and cluster beamlines, as well as the characteristics of the analysis and detection systems, are described. Collisions with highly charged ions such as Ar8+ or Xe30+ turn out to be efficient tools in preparing clusters in high charge states without increasing significantly their internal temperature. Measurements performed in coincidence with the number of electrons stabilized by the projectile ion after the collision allowed us to control the charge and the excitation energy of the ionized system. The efficiency of the method is demonstrated for sodium clusters and C-60 molecules. (C) 1999 American Institute of Physics. [S0034-6748(99)04708-5].

引用

页码：3244 / 3253

页数：10

共 33 条

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