Nanocrystalline Co-ferrite films with high perpendicular coercivity

被引：33

作者：

Yin, JH

Ding, J ^{[1
]}

Liu, BH

Miao, XS

Chen, JS

机构：

[1] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119620, Singapore

[2] Data Storage Inst, Singapore 117608, Singapore

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 16期

关键词：

D O I：

10.1063/1.2196472

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Co-ferrite films were prepared using pulsed laser deposition at low substrate temperatures in this work. Magnetic properties of these films have been investigated in the function of substrate temperature and film thickness. A perpendicular coercivity as high as 12.5 kOe has been achieved in the Co-ferrite film with a thickness of 33 nm deposited at 550 degrees C. The high coercivity mechanism is possibly associated with nanocrystalline structure, textured structure, and presence of relatively large residual strain. (c) 2006 American Institute of Physics.

引用

页数：3

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