Nanoscale tribophysics and tribomechanics

被引:87
作者
Bhushan, B [1 ]
机构
[1] Ohio State Univ, Dept Mech Engn, Comp Microtribol & Contaminat Lab, Columbus, OH 43210 USA
关键词
nanotribology; AFM; friction; wear; lubrication;
D O I
10.1016/S0043-1648(99)00018-6
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Atomic force microscopy/friction force microscopy (AFM/FFM) techniques are increasingly used for tribological studies of engineering surfaces at scales ranging from atomic and molecular to microscales. These techniques have been used to study surface roughness, adhesion, friction, scratching/wear, indentation, detection of material transfer, and boundary lubrication and for nanofabrication/nanomachining purposes. This invited keynote paper presents a state of the art of nanoscale tribophysics and tribomechanics. (C) 1999 Published by Elsevier Science S.A. All rights reserved.
引用
收藏
页码:465 / 492
页数:28
相关论文
共 46 条
[1]   NANOINDENTATION HARDNESS MEASUREMENTS USING ATOMIC-FORCE MICROSCOPY [J].
BHUSHAN, B ;
KOINKAR, VN .
APPLIED PHYSICS LETTERS, 1994, 64 (13) :1653-1655
[2]   MICRO/NANOTRIBOLOGY AND ITS APPLICATIONS TO MAGNETIC STORAGE DEVICES AND MEMS [J].
BHUSHAN, B .
TRIBOLOGY INTERNATIONAL, 1995, 28 (02) :85-96
[3]   TRIBOLOGICAL STUDIES OF SILICON FOR MAGNETIC RECORDING APPLICATIONS [J].
BHUSHAN, B ;
KOINKAR, VN .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) :5741-5746
[4]  
Bhushan B., 1994, Proceedings of the Institution of Mechanical Engineers, Part J (Journal of Engineering Tribology), V208, P17, DOI 10.1243/PIME_PROC_1994_208_346_02
[5]   MICROTRIBOLOGICAL CHARACTERIZATION OF SELF-ASSEMBLED AND LANGMUIR-BLODGETT MONOLAYERS BY ATOMIC AND FRICTION FORCE MICROSCOPY [J].
BHUSHAN, B ;
KULKARNI, AV ;
KOINKAR, VN ;
BOEHM, M ;
ODONI, L ;
MARTELET, C ;
BELIN, M .
LANGMUIR, 1995, 11 (08) :3189-3198
[6]   Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy [J].
Bhushan, B ;
Sundararajan, S .
ACTA MATERIALIA, 1998, 46 (11) :3793-3804
[7]   Nanoindentation and picoindentation measurements using a capacitive transducer system in atomic force microscopy [J].
Bhushan, B ;
Kulkarni, AV ;
Bonin, W ;
Wyrobek, JT .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 74 (05) :1117-1128
[8]   NANOTRIBOLOGY - FRICTION, WEAR AND LUBRICATION AT THE ATOMIC-SCALE [J].
BHUSHAN, B ;
ISRAELACHVILI, JN ;
LANDMAN, U .
NATURE, 1995, 374 (6523) :607-616
[9]   Micro/nanotribology using atomic force microscopy/friction force microscopy: state of the art [J].
Bhushan, B .
PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART J-JOURNAL OF ENGINEERING TRIBOLOGY, 1998, 212 (J1) :1-18
[10]   Effect of normal load on microscale friction measurements [J].
Bhushan, B ;
Kulkarni, AV .
THIN SOLID FILMS, 1996, 278 (1-2) :49-56