Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy

被引:39
作者
de Pablo, PJ [1 ]
Gómez-Navarro, C
Martínez, MT
Benito, AM
Maser, WK
Colchero, J
Gómez-Herrero, J
Baró, AM
机构
[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, Au Queried Lab Nuevas Microscopias, E-28049 Madrid, Spain
[2] CSIC, Inst Carboquim, E-50015 Zaragoza, Spain
[3] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Nuevas Microscopias, E-28049 Madrid, Spain
关键词
D O I
10.1063/1.1453475
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, a method is presented to perform current versus voltage measurements on carbon nanotubes using the tip of a scanning force microscope as an electrode that can be positioned along the molecule, This method allows current versus voltage measurements to be carried out at any spot along a nanotube. By using this method, we present indications of ballistic transport in carbon nanotubes. as well as effects in the electrical properties due to the mechanical deformation. This is a general technique that can be applied to any conducting nanowire. (C) 2002 American Institute of Physics.
引用
收藏
页码:1462 / 1464
页数:3
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