Radiation damage to fullerite (C60) in the transmission electron microscope

被引：17

作者：

Egerton, RF

Takeuchi, M

机构：

[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada

[2] Ibaraki Univ, Dept Elect & Elect Engn, Hitachi, Ibaraki 3168511, Japan

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 13期

关键词：

D O I：

10.1063/1.124860

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron energy-loss spectroscopy was used to monitor structural damage to solid C-60 as a function of electron exposure. The characteristic dose was found to be in the range 300-700 C/cm(2) for incident energies in the range 100-200 keV and specimen temperatures between 100 and 300 K. The absolute value of this dose, and its energy and temperature dependence, suggest that the damage mechanism is predominantly electronic rather than knock-on displacement. (C) 1999 American Institute of Physics. [S0003-6951(99)04339-9].

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页码：1884 / 1886

页数：3

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