ELECTRON-BEAM-INDUCED STRUCTURAL-CHANGES IN CRYSTALLINE C-60 AND C-70

被引:23
作者
SERAPHIN, S [1 ]
ZHOU, D [1 ]
JIAO, J [1 ]
机构
[1] UNIV ARIZONA,DEPT PHYS,TUCSON,AZ 85721
关键词
D O I
10.1557/JMR.1993.1895
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-resolution transmission electron microscopy (HRTEM), electron diffraction, and electron energy-loss spectroscopy (EELS) were used to characterize electron-beam-induced structural transformations in crystalline samples of C60 and C70. During these transformations, the electron-diffraction patterns became progressively more diffuse, with the outer diffraction spots disappearing first, followed in succession by the disappearance of the inner spots. We interpret this course of evolution in the diffraction patterns as evidence of degradation of the crystalline structure via the destruction of individual molecules, as opposed to electron-beam-induced motion of intact fullerene molecules. EELS analyses of the data indicate that the final state of these transformations was amorphous carbon.
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页码:1895 / 1899
页数:5
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