Nanometer focusing of hard x rays by phase zone plates

被引:203
作者
Yun, W
Lai, B
Cai, Z
Maser, J
Legnini, D
Gluskin, E
Chen, Z
Krasnoperova, AA
Vladimirsky, Y
Cerrina, F
Di Fabrizio, E
Gentili, M
机构
[1] Argonne Natl Lab, Expt Facil Div, Argonne, IL 60439 USA
[2] Univ Wisconsin, Dept Elect & Comp Engn, Ctr Xray Lithog, Madison, WI 53706 USA
[3] CNR, Ist Elettron Stato Solido, I-00156 Rome, Italy
关键词
D O I
10.1063/1.1149744
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)02705-7].
引用
收藏
页码:2238 / 2241
页数:4
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