An advanced magnetic reflectometer

被引：24

作者：

Brueck, Sebastian ^{[1
]}

Bauknecht, Steffen ^{[1
]}

Ludescher, Bernd ^{[1
]}

Goering, Eberhard ^{[1
]}

Schuetz, Gisela ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 08期

关键词：

D O I：

10.1063/1.2970941

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup. (C) 2008 American Institute of Physics.

引用

页数：6

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