Diffractometer for soft x-ray resonant magnetic scattering

被引：65

作者：

Grabis, J ^{[1
]}

Nefedov, A ^{[1
]}

Zabel, H ^{[1
]}

机构：

[1] Ruhr Univ Bochum, Inst Expt Phys Festkorperphys, D-44780 Bochum, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 09期

关键词：

D O I：

10.1063/1.1602932

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on the design and construction of a new diffractometer for soft x-ray resonant magnetic scattering which has been built at the Ruhr-University Bochum. The ultrahigh vacuum-compatible diffractometer comprises a two-circle goniometer and works in horizontal scattering geometry. Rotation of the detector and sample is realized by two differentially pumped rotating platforms with motors and gears external to the vacuum. The sample environment consists of a closed-cycle He cryostat that allows heating up to 600 K and applying a magnetic field of +/-2.5 kOe. All functions of the experimental setup have been extensively tested at the BESSY II Synchrotron (beamline PM3). The experimental results demonstrate the performance of the instrument. (C) 2003 American Institute of Physics.

引用

页码：4048 / 4051

页数：4

共 17 条

[1] A structural probe of the doped holes in cuprate superconductors [J].

Abbamonte, P ;

Venema, L ;

Rusydi, A ;

Sawatzky, GA ;

Logvenov, G ;

Bozovic, I .

SCIENCE, 2002, 297 (5581) :581-584

[2] Magnetic properties of bct FexMn1-x thin-film alloys investigated by linearly polarized soft-x-ray resonant magnetic reflectivity [J].

Dèchelette, A ;

Tonnerre, JM ;

Saint Lager, MC ;

Bartolomé, F ;

Sève, L ;

Raoux, D ;

Fischer, H ;

Piecuch, M ;

Chakarian, V ;

Kao, CC .

PHYSICAL REVIEW B, 1999, 60 (09) :6636-6645

[3] Exploring magnetic roughness in CoFe thin films [J].

Freeland, JW ;

Chakarian, V ;

Bussmann, K ;

Idzerda, YU ;

Wende, H ;

Kao, CC .

JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) :6290-6292

[4] Preparation and structural properties of thin films and multilayers of the Heusler compounds Cu2MnAl, Co2MnSn, Co2MnSi and Co2MnGe [J].

Geiersbach, U ;

Bergmann, A ;

Westerholt, K .

THIN SOLID FILMS, 2003, 425 (1-2) :225-232

[5] Structural, magnetic and magnetotransport properties of thin films of the Heusler alloys Cu2MnAl, Co2MnSi, Co2MnGe and Co2MnSn [J].

Geiersbach, U ;

Bergmann, A ;

Westerholt, K .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2002, 240 (1-3) :546-549

[6] Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry -: art. no. 020405 [J].

Geissler, J ;

Goering, E ;

Justen, M ;

Weigand, F ;

Schütz, G ;

Langer, J ;

Schmitz, D ;

Maletta, H ;

Mattheis, R .

PHYSICAL REVIEW B, 2002, 65 (02) :1-4

[7] POLARIZATION AND RESONANCE PROPERTIES OF MAGNETIC-X-RAY SCATTERING IN HOLMIUM [J].

GIBBS, D ;

HARSHMAN, DR ;

ISAACS, ED ;

MCWHAN, DB ;

MILLS, D ;

VETTIER, C .

PHYSICAL REVIEW LETTERS, 1988, 61 (10) :1241-1244

[8] X-RAY RESONANCE EXCHANGE SCATTERING [J].

HANNON, JP ;

TRAMMELL, GT ;

BLUME, M ;

GIBBS, D .

PHYSICAL REVIEW LETTERS, 1988, 61 (10) :1245-1248

[9] Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers [J].

Hase, TPA ;

Pape, I ;

Tanner, BK ;

Dürr, H ;

Dudzik, E ;

van der Laan, G ;

Marrows, CH ;

Hickey, BJ .

PHYSICAL REVIEW B, 2000, 61 (06) :R3792-R3795

[10] Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers [J].

Hase, TPA ;

Pape, I ;

Read, DE ;

Tanner, BK ;

Dürr, H ;

Dudzik, E ;

van der Laan, G ;

Marrows, CH ;

Hickey, BJ .

PHYSICAL REVIEW B, 2000, 61 (22) :15331-15337

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