Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers

被引：40

作者：

Hase, TPA

Pape, I

Tanner, BK

Dürr, H

Dudzik, E

van der Laan, G

Marrows, CH

Hickey, BJ

机构：

[1] Univ Durham, Dept Phys, Durham DH1 3LE, England

[2] SERC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England

[3] Univ Leeds, Dept Phys & Astron, Leeds LS2 9JT, W Yorkshire, England

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.61.R3792

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

By separately identifying magnetic and charge scatter, we find conclusive evidence for conformality in magnetic roughness in {Co (8 Angstrom) Cu (9 Angstrom)} multilayers. For layers magnetized in the easy direction, the magnetic roughness equals the structural roughness but increases when magnetized in the hard direction. The in-plane magnetic correlation length, which changes on magnetization is several orders of magnitude larger than the structural roughness length scales. The magnetic length scale is bf the same order as;magnetic ripple observed in Lorentz microscopy and is not associated with domains.

引用

页码：R3792 / R3795

页数：4

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