Imaging the internal and external pore structure of membranes in fluid: TappingMode scanning ion conductance microscopy

被引:63
作者
Proksch, R
Lal, R
Hansma, PK
Morse, D
Stucky, G
机构
[1] UNIV CALIF SANTA BARBARA,DEPT PHYS,SANTA BARBARA,CA 93106
[2] UNIV CALIF SANTA BARBARA,DEPT BIOL,SANTA BARBARA,CA 93106
[3] UNIV CALIF SANTA BARBARA,DEPT CHEM,SANTA BARBARA,CA 93106
基金
美国国家科学基金会;
关键词
D O I
10.1016/S0006-3495(96)79416-X
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
We have constructed a combined TappingMode atomic force microscope and scanning ion conductance microscope. The design is based on a bent glass pipette that acts as both the force sensor and conductance probe. Measuring the pipette deflection allows more stable feedback than possible with previous versions of the scanning ion conductance microscope. Using this microscope, we have imaged synthetic membranes in both contact and tapping modes under fluid. Although contact mode operation is possible, we found that our microscope provided higher contrast and less apparent sample damage in the topographic and ionic conductance images in the tapping mode.
引用
收藏
页码:2155 / 2157
页数:3
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