HREM study of Co/Cu/Co/MnFe spin valves

被引：27

作者：

Bayle-Guillemaud, P ^{[1
]}

PetfordLong, AK ^{[1
]}

Anthony, TC ^{[1
]}

Brug, JA ^{[1
]}

机构：

[1] HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期

关键词：

D O I：

10.1109/20.539100

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High resolution electron microscopy (HREM) has been used to investigate the structure of Co(6nm)/Cu(2.8nm)/Co(4nm)/MnFe(12nm) spin valves so as to correlate the structure with the magnetic properties. The presence of a Ti seed layer enhances the structural quality of the film giving a strong <111> texture and large grain size. It is shown that the <111> texture favours a high exchange bias field. A numerical analysis of the HREM micrographs has been carried out in order to investigate more quantitatively the structure of the interfaces. It has been shown that locally they are diffuse over 2 monolayers in the growth direction.

引用

页码：4627 / 4629

页数：3

共 6 条

[1] GIANT MAGNETORESISTANCE IN SOFT FERROMAGNETIC MULTILAYERS
DIENY, B
SPERIOSU, VS
PARKIN, SSP
GURNEY, BA
WILHOIT, DR
MAURI, D
[J]. PHYSICAL REVIEW B, 1991, 43 (01): : 1297 - 1300
[2] ORIENTATIONAL DEPENDENCE OF THE EXCHANGE BIASING IN MOLECULAR-BEAM-EPITAXY-GROWN NI80FE20/FE50MN50 BILAYERS
JUNGBLUT, R
COEHOORN, R
JOHNSON, MT
DESTEGGE, JA
REINDERS, A
[J]. JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) : 6659 - 6664
[3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INTERFACES IN FCC MATERIALS
MERKLE, KL
[J]. ULTRAMICROSCOPY, 1991, 37 (1-4) : 130 - 152
[4] MAGNETORESISTANCE AND PREFERRED ORIENTATION IN FE-MN/NI-FE/CU/NI-FE SANDWICHES WITH VARIOUS BUFFER LAYER MATERIALS
NAKATANI, R
HOSHINO, K
NOGUCHI, S
SUGITA, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (1A): : 133 - 137
[5] ROUVIERE JL, 1994, ELECT MICROSCOPY A, V2, P123
[6] PROGRESS TOWARDS QUANTITATIVE HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
DERUIJTER, WJ
MCCARTNEY, MR
WEISS, JK
[J]. ULTRAMICROSCOPY, 1993, 52 (3-4) : 591 - 601

← 1 →