Reflection and absorption techniques for optical characterization of chemically assembled nanomaterials

被引：120

作者：

Roy, D

Fendler, J ^{[1
]}

机构：

[1] Clarkson Univ, Dept Phys, Potsdam, NY 13699 USA

[2] Clarkson Univ, Dept Chem, Potsdam, NY 13699 USA

[3] Clarkson Univ, Ctr Adv Mat Proc, Potsdam, NY 13699 USA

来源：

ADVANCED MATERIALS | 2004年 / 16卷 / 06期

关键词：

D O I：

10.1002/adma.200306195

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

This review discusses recent developments in the areas of fabrication, certain types of optical characterization, and applications of a selected class of chemically assembled nanomaterials, namely i) gold and silver nanoparticles deposited onto optically transparent glass substrates; ii) thiol-functionalized self-assembled monolayers (SAMs); iii) chemically stabilized gold and silver nanoparticles (monolayer protected clusters, MPCs); and iv) MPCs linked to metallic substrates and adsorbates. Six linear optical techniques for the characterization of these materials are discussed: transmission localized surface plasmon resonance spectroscopy, T-LSPR; propagating surface plasmon resonance spectroscopy, P-SPR; polarization-selective Fourier transform infrared reflection absorption spectroscopy, PS-FTIRRAS; polarization-modulation Fourier transform infrared reflection absortion spectroscopy, PM-FTIRRAS; surface-enhanced infrared reflection p absorption spectroscopy, SEIRRAS; and infrared ellipsometry. The review focuses particularly on providing a unified treatment of these six optical techniques by using a relatively simple stratified multilayer model.

引用

页码：479 / 508

页数：30

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