Intrinsic burn-in efficiency loss of small-molecule organic photovoltaic cells due to exciton-induced trap formation

被引:38
作者
Tong, Xiaoran [1 ]
Wang, Nana [2 ,3 ]
Slootsky, Michael [4 ]
Yu, Junsheng [3 ]
Forrest, Stephen R. [1 ,2 ,4 ]
机构
[1] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
[3] Univ Elect Sci & Technol China, Dept Optoelect Informat, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
[4] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
关键词
Reliability; Lifetime; Aging; Small molecule; SOLAR-CELLS; PHOTOINDUCED DEGRADATION; POLYMER; LAYERS;
D O I
10.1016/j.solmat.2013.08.006
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The intrinsic degradation mechanisms leading to the initial burn-in deterioration in power conversion efficiency in small-molecule-based organic photovoltaics (OPVs) are studied. Specifically, we examine degradation in archetype boron subphthalocyanine chloride/fullerene OPVs in the absence of atmospheric contaminants such as water and oxygen. During the initial burn-in period (< 20 h), planar OPVs employing C-60 as the acceptor exhibits a rapid decrease in efficiency that is primarily due to a reduction in photocurrent contributed by excitons generated in C-60, as observed by the changes in the spectrally-resolved external quantum efficiency. We develop an analytical model that ascribes the decrease in power conversion efficiency with aging to an energetically-driven increase in the density of exciton-induced quenching sites that hinder exciton diffusion to the donor-acceptor interface. This mechanism is mitigated by employing a C-70 acceptor, or a mixed donor-acceptor active layer where excitons are rapidly dissociated following photogeneration, thereby significantly reducing their lifetime and density. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:116 / 123
页数:8
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