Zernike polynomials as a basis for wave-front fitting in lateral shearing interferometry

被引:39
作者
vanBrug, H
机构
[1] Department of Applied Physics, Optics Research Group, Delft University of Technology, Delft, 2628 CJ
来源
APPLIED OPTICS | 1997年 / 36卷 / 13期
关键词
D O I
10.1364/AO.36.002788
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new method for handling Zernike polynomials is presented. Owing to its efficiency, this method enables the use of Zernike polynomials as a basis for wave-front fitting in shearography systems. An excerpt of a C++ class is presented to show how the polynomials are calculated and represented in computer memory. (C) 1997 Optical Society of America.
引用
收藏
页码:2788 / 2790
页数:3
相关论文
共 5 条
[1]   CLOSED CARTESIAN REPRESENTATION OF THE ZERNIKE POLYNOMIALS [J].
CARPIO, M ;
MALACARA, D .
OPTICS COMMUNICATIONS, 1994, 110 (5-6) :514-516
[2]  
MALACARA D, 1992, OPTICAL SHOP TESTING, P466
[3]  
Press W., 1995, NUMERICAL RECIPES C, V2nd
[4]   EVALUATION OF LARGE ABERRATIONS USING A LATERAL-SHEAR INTERFEROMETER HAVING VARIABLE SHEAR [J].
RIMMER, MP ;
WYANT, JC .
APPLIED OPTICS, 1975, 14 (01) :142-150
[5]   GRAM-SCHMIDT ORTHONORMALIZATION OF ZERNIKE POLYNOMIALS FOR GENERAL APERTURE SHAPES [J].
SWANTHNER, W ;
CHOW, WW .
APPLIED OPTICS, 1994, 33 (10) :1832-1837