Ultraviolet surface plasmons on aluminium and a non-contact technique for characterizing short-pitch gratings

被引:4
作者
Hallam, BT
Sambles, JR
Kitson, SC
机构
[1] Univ Exeter, Sch Phys, Exeter EX4 4QL, Devon, England
[2] Hewlett Packard Labs, Bristol BS12 6QZ, Avon, England
关键词
D O I
10.1080/09500349908230403
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this work we present grating-coupled surface plasmon characterization of aluminium in the ultraviolet. Light of wavelength 325 nm from a helium-cadmium laser was used to excite surface plasmon-polaritons both at a buried aluminium-silica interface and on oxidized aluminium. By fitting the angle-dependent reflectivity data to model grating theory, the optical permittivity of uncontaminated aluminium at 325 nm is deduced. These results are compared with those extrapolated from prism-coupled surface plasmon excitation in the visible. The further characterization of the oxidized aluminium allows optical non-contact profilometry to be performed on short-pitch gratings that are opaque or are comprised of materials with ill-defined optical properties. This profile characterization is demonstrated for a short-pitch grating manufactured in photoresist.
引用
收藏
页码:1099 / 1105
页数:7
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