Size and grain-boundary effects of a gold nanowire measured by conducting atomic force microscopy

被引：85

作者：

Bietsch, A ^{[1
]}

Michel, B ^{[1
]}

机构：

[1] IBM Corp, Zurich Res Lab, Res, CH-8803 Ruschlikon, Switzerland

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 18期

关键词：

D O I：

10.1063/1.1473868

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The resistivities of thin metal films and wires are highly sensitive to their polycrystalline structure and surface morphology because grain boundaries and surfaces provide additional scattering sites compared to bulk materials. Here, we investigated polycrystalline gold wires of nanometer-scale diameter that were-at some locations-connected through single grain boundaries. A detailed topography of the wires was recorded by atomic force microscopy. A Pt-coated tip in a conducting atomic force microscopy setup served as a mobile electrode to probe the resistance of a wire. Analyzing the topographical cross section and the resistance data allowed us to evaluate the effective specific resistivity of the wire as well as reflection coefficients of single grain boundaries. (C) 2002 American Institute of Physics.

引用

页码：3346 / 3348

页数：3

共 17 条

[1]

[Anonymous], ZH EKSP TEOR FIZ

[2] Electrical testing of gold nanostructures by conducting atomic force microscopy [J].

Bietsch, A ;

Schneider, MA ;

Welland, ME ;

Michel, B .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03) :1160-1170

[3] Fabrication of gold nanowires on insulating substrates by field-induced mass transport [J].

Calleja, M ;

Tello, M ;

Anguita, J ;

García, F ;

García, R .

APPLIED PHYSICS LETTERS, 2001, 79 (15) :2471-2473

[4] Transport mechanisms of alkanethiols during microcontact printing on gold [J].

Delamarche, E ;

Schmid, H ;

Bietsch, A ;

Larsen, NB ;

Rothuizen, H ;

Michel, B ;

Biebuyck, H .

JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (18) :3324-3334

[5] RESISTIVITY OF THIN AU FILMS AS A FUNCTION OF GRAIN DIAMETER AND TEMPERATURE [J].

DEVRIES, JWC .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1987, 17 (09) :1945-1952

[6] Size effects in the electrical resistivity of polycrystalline nanowires [J].

Durkan, C ;

Welland, ME .

PHYSICAL REVIEW B, 2000, 61 (20) :14215-14218

[7] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[8] FEATURES OF GOLD HAVING MICROMETER TO CENTIMETER DIMENSIONS CAN BE FORMED THROUGH A COMBINATION OF STAMPING WITH AN ELASTOMERIC STAMP AND AN ALKANETHIOL INK FOLLOWED BY CHEMICAL ETCHING [J].

KUMAR, A ;

WHITESIDES, GM .

APPLIED PHYSICS LETTERS, 1993, 63 (14) :2002-2004

[9] SPATIAL VARIATION OF CURRENTS AND FIELDS DUE TO LOCALIZED SCATTERERS IN METALLIC CONDUCTION [J].

LANDAUER, R .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1957, 1 (03) :223-231

[10] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

← 1 2 →