Effect of post-heat treatment on the electrical and optical properties of ZnO:Al thin films

被引:68
作者
Musat, V [1 ]
Teixeira, B
Fortunato, E
Monteiro, RCC
机构
[1] Dunarea de Jos Univ Galati, Dept Met & Mat Sci, Galati 800008, Romania
[2] Univ Nova Lisboa, Fac Sci & Technol, CENIMAT, Dept Mat Sci, P-2829516 Caparica, Portugal
关键词
zinc oxide thin film; sol-gel; electrical properties; optical properties;
D O I
10.1016/j.tsf.2005.07.278
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents the effect of post-heating temperature and atmosphere on the electrical and optical properties of ZnO:Al thin films prepared by the sol-gel method. The electrical properties of the n-type semiconductor thin films showed that for the final films, the values of carrier concentration ranged between 2.76 and 9.96 x 10(19) cm(-3), the Hall mobility values between 7 and 34.1 cm(2)/V s and the resistivity values between 2.9 x 10(-3) and 5.0 x 10(-2) Omega cm, depending on the processing conditions. For the thin film doped with 2 wt.% Al, preheated at 400 degrees C and post-heated for 1 h in air at 600 degrees C, a resistivity of 2.9 x 10(-3) Omega cm has been reached after annealing under a reducing atmosphere of forming gas. The optical transmittance spectra of the only post-heated films and of the post-heated and annealed films showed a good transmittance (75-90%) within the visible wavelength region and some small effects of Al-doping concentration and annealing treatment in forming gas. (c) 2005 Elsevier B.V. All fights reserved.
引用
收藏
页码:219 / 222
页数:4
相关论文
共 5 条
[1]   Influence of the deposition pressure on the properties of transparent and conductive ZnO:Ga thin-film produced by r.f. sputtering at room temperature [J].
Assunçao, V ;
Fortunato, E ;
Marques, A ;
Aguas, H ;
Ferreira, I ;
Costa, MEV ;
Martins, R .
THIN SOLID FILMS, 2003, 427 (1-2) :401-405
[2]   Effects of post-annealing on the structure and properties of Al-doped zinc oxide films [J].
Chang, JF ;
Lin, WC ;
Hon, MH .
APPLIED SURFACE SCIENCE, 2001, 183 (1-2) :18-25
[3]   Crystallization behavior and origin of c-axis orientation in sol-gel-derived ZnO:Li thin films on glass substrates [J].
Fujihara, S ;
Sasaki, C ;
Kimura, T .
APPLIED SURFACE SCIENCE, 2001, 180 (3-4) :341-350
[4]  
HARTNAGEL H., 1995, Semiconducting Transparent Thin Films
[5]   Performances presented by zinc oxide thin films deposited by spray pyrolysis [J].
Nunes, P ;
Fernandes, B ;
Fortunato, E ;
Vilarinho, P ;
Martins, R .
THIN SOLID FILMS, 1999, 337 (1-2) :176-179