Micromachined piezoresistive cantilever array with integrated resistive microheater for calorimetry and mass detection

被引:59
作者
Abedinov, N
Grabiec, P
Gotszalk, T
Ivanov, T
Voigt, J
Rangelow, IW
机构
[1] Univ Kassel, IMA, Inst Technol Phys, D-34132 Kassel, Germany
[2] Wroclaw Univ Technol, Inst Microsys Technol, PL-50372 Wroclaw, Poland
[3] Inst Electr Mat Technol, PL-02668 Warsaw, Poland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2001年 / 19卷 / 06期
关键词
D O I
10.1116/1.1412654
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We describe a microcantilever calorimeter consisting of an array of ten cantilevers. Each single cantilever is capable of detecting heat energy with the resolution of 50 nW Hz((-0.5)). The device is based on a Si microcantilever coated with a 1 mum thick layer of SiO2 deposited with a 700 nm thick layer of aluminum Which forms a resistive microheater. Heat fluxes are monitored by detecting the cantilever deflection (bending) due to the bimaterial structure of the cantilever (dissimilar thermal expansion properties of SiO2 and A1). The resistive microheater serves for calibration of the heat flux and for temperature sensing. In our design a piezoresistive Wheatstone bridge detector is applied for measurements of the cantilever beam deflection. The cantilever displacement detection system enables investigations in ultrahigh vacuum and low temperature conditions. The microcantilevers are manufactured in a one-dimensional array having ten individual microcantilevers which is the first step in the fabrication of an infrared detector array with spatial resolution. The displacement sensitivity versus temperature change of the described sensor array as a function of temperature change is of about 2 nm/K and an estimated resolution limit of temperature detection is approximate to 10(-3) K at 300 K. In order to demonstrate the cantilever bending sensitivity we employ the piezoresistive cantilever array as a picogram microbalance. (C) 2001 American Vacuum Society.
引用
收藏
页码:2884 / 2888
页数:5
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