共 9 条
- [2] GOTSZALK T, 1996, P SOC PHOTO-OPT INS, V2880, P263
- [3] Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 856 - 860
- [4] Rangelow IW, 1996, P SOC PHOTO-OPT INS, V2879, P56, DOI 10.1117/12.251232
- [5] Roark R.J., 1975, FORMULAS STRESS STRA, DOI DOI 10.1016/j.vaccine.2008.10.077
- [7] Dry etching with gas chopping without rippled sidewalls [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 2768 - 2771
- [8] Zambov LM, 2000, ADV MATER, V12, P656, DOI 10.1002/(SICI)1521-4095(200005)12:9<656::AID-ADMA656>3.0.CO
- [9] 2-S