Microstructure and ferroelectric properties of fine-grained BaxSr1-xTiO3 thin films prepared by metalorganic decomposition

被引：38

作者：

Mohammed, MS ^{[1
]}

Naik, R ^{[1
]}

Mantese, JV ^{[1
]}

Schubring, NW ^{[1
]}

Micheli, AL ^{[1
]}

Catalan, AB ^{[1
]}

机构：

[1] GM CORP,RES & DEV LABS,DEPT ELECT & ELECT,WARREN,MI 48090

来源：

JOURNAL OF MATERIALS RESEARCH | 1996年 / 11卷 / 10期

关键词：

D O I：

10.1557/JMR.1996.0325

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin films of BaxSr1-xTiO3 (x = 0.7, 0.8, 0.9, and 1.0) were prepared by metalorganic decomposition (MOD). The relative permittivity, dissipation, polarization, resistivity, and grain size of these films were studied as a function of composition and temperature. Ferroelectric hysteresis loops were observed for all values of x and were found to be independent of measurement temperature though strongly dependent upon grain size.

引用

页码：2588 / 2593

页数：6

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