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Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions

被引：125
作者：
Fletcher, John S. [1 ]
Vickerman, John C. [1 ]
机构：
[1] Univ Manchester, Manchester Inst Biotechnol, Manchester M13 9PL, Lancs, England
来源：
ANALYTICAL CHEMISTRY | 2013年 / 85卷 / 02期
基金：
英国工程与自然科学研究理事会;
关键词：
MOLECULAR-DYNAMICS SIMULATIONS; METAL-ASSISTED SIMS; TOF-SIMS; STATIC SIMS; MULTIVARIATE-ANALYSIS; CLUSTER BOMBARDMENT; IN-SITU; QUANTITATIVE-ANALYSIS; MULTILAYER STRUCTURES; ANALYSIS STRATEGIES;
D O I：
10.1021/ac303088m
中图分类号：
O65 [分析化学];
学科分类号：
070302 [分析化学];
摘要：
[No abstract available]
引用
收藏
页码：610 / 639
页数：30
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