Imaging in scanning tunneling microscopy and its relationship with surface roughness

被引:3
作者
Aguilar, M [1 ]
Oliva, AI
Anguiano, E
机构
[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Escuela Tecn Super Informat, E-28049 Madrid, Spain
来源
EUROPHYSICS LETTERS | 1999年 / 46卷 / 04期
关键词
D O I
10.1209/epl/i1999-00281-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We study the texture of surfaces imaged by scanning tunneling microscopy (STM) under different; control conditions in the feedback loop of the STMs control unit. The surface texture parameters such as the rms-roughness, the average wavelength and the fractal character have a strong dependence on the values of the parameters used in the feedback: loop even when the visual quality of the images is the same. The reliability of the images can be described quantitatively by giving the values of two nondimensional parameters that described the measurement conditions.
引用
收藏
页码:442 / 447
页数:6
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