A new approach for electron tomography: Annular dark-field transmission electron microscopy

被引：56

作者：

Bals, S

Van Tendeloo, G

Kisielowski, C

机构：

[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

[2] Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

ADVANCED MATERIALS | 2006年 / 18卷 / 07期

关键词：

D O I：

10.1002/adma.200502201

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

引用

页码：892 / +

页数：5

共 18 条

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