A new approach for electron tomography: Annular dark-field transmission electron microscopy

被引：56

作者：

Bals, S

Van Tendeloo, G

Kisielowski, C

机构：

[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

[2] Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

ADVANCED MATERIALS | 2006年 / 18卷 / 07期

关键词：

D O I：

10.1002/adma.200502201

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

引用

页码：892 / +

页数：5

共 18 条

[11] Pennycook SJ, 2002, ADV IMAG ELECT PHYS, V123, P173
[12] Synthesis of novel multi-branched carbon nanotubes with alkali-element modified Cu/MgO catalyst
Tao, XY
Zhang, XB
Cheng, JP
Wang, YW
Liu, F
Luo, ZQ
[J]. CHEMICAL PHYSICS LETTERS, 2005, 409 (1-3) : 89 - 92
[13] DISLOCATION CONTRAST IN HIGH-ANGLE HOLLOW-CONE DARK-FIELD TEM
WANG, ZL
[J]. ULTRAMICROSCOPY, 1994, 53 (01) : 73 - 90
[14] ELECTRON ENERGY-LOSS SPECTROSCOPY OF HIGH-ANGLE THERMAL-DIFFUSE-SCATTERED ELECTRONS IN TEM
WANG, ZL
FISHER, AT
[J]. ULTRAMICROSCOPY, 1993, 48 (1-2) : 183 - 196
[15] Electron tomography
Weyland, Matthew
Midgley, Paul A.
[J]. MATERIALS TODAY, 2004, 7 (12) : 32 - 40
[16] Williams D.B., 1996, TRANSMISSION ELECT M
[17] ZANDBERGEN H, COMMUNICATION
[18] Electron tomography: a tool for 3D structural probing of heterogeneous catalysts at the nanometer scale
Ziese, U
de Jong, KP
Koster, AJ
[J]. APPLIED CATALYSIS A-GENERAL, 2004, 260 (01) : 71 - 74

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