Mapping of the reciprocal network on epitaxial thin layers using a setup with a curved-position sensitive detector

被引：1

作者：

Guinebretière, R ^{[1
]}

Boulle, A ^{[1
]}

Masson, O ^{[1
]}

Dauger, A ^{[1
]}

机构：

[1] ENSCI, UMR 6638, Equipe Org Struct Mutiechelle Mat, F-87065 Limoges, France

来源：

JOURNAL DE PHYSIQUE IV | 2002年 / 12卷 / PR6期

关键词：

D O I：

10.1051/jp4:20020236

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

two-dimensional distributions of intensity diffracted by epitaxial layers have been measured using a setup associating a four reflections monochromator and a curved position sensitive detector. Microstructural parameters of oxide thin films elaborated by sol-gel route were evaluated by profile modeling of different sections of reciprocal space maps of several reflections.

引用

页码：273 / 281

页数：9

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