Miscut angles measurement and precise sample positioning with a four circle diffractometer

被引：21

作者：

Boulle, A

Masson, O

Guinebretière, R

Dauger, A

机构：

[1] ENSCI, UMR 6638, CNRS, Sci Procedes Ceram & Traitements Surface, F-87065 Limoges, France

[2] Fac Sci, UMR 6638, CNRS, Sci Procedes Ceram & Traitements Surface, F-87060 Limoges, France

来源：

APPLIED SURFACE SCIENCE | 2001年 / 180卷 / 3-4期

关键词：

X-ray diffraction; substrates; miscut;

D O I：

10.1016/S0169-4332(01)00369-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A method is derived for precise sample positioning with a four circle diffractometer. The sample can be oriented either with respect to a crystallographic plane or with respect to the sample surface with an accuracy of about 0.001 degrees. The miscut angles can be easily deduced with an accuracy of a few 1/1000 degrees. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：322 / 327

页数：6

共 22 条

[1]

[Anonymous], SPRINGER TRACTS MODE

[2]

[Anonymous], ADV XRAY ANAL

[3] ANGLE AND INDEX CALCULATIONS FOR A Z-AXIS X-RAY DIFFRACTOMETER [J].