ANGLE AND INDEX CALCULATIONS FOR A Z-AXIS X-RAY DIFFRACTOMETER

被引：54

作者：

BLOCH, JM

机构：

[1] Brookhaven Natl Lab, Natl, Synchrotron Light Source, Upton, NY,, USA, Brookhaven Natl Lab, Natl Synchrotron Light Source, Upton, NY, USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1985年 / 18卷 / FEB期

关键词：

D O I：

10.1107/S0021889885009724

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

9

引用

收藏

页码：33 / 36

页数：4

相关论文

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