STM studies of initial In growth on Si(100)2x1: The In ad-dimer chain and its I-V characteristics

被引:34
作者
Dong, ZC
Yakabe, T
Fujita, D
Jiang, QD
Nejo, H
机构
[1] Natl. Research Institute for Metals, Tsukuba, Ibaraki 305
关键词
growth; indium; metal-semiconductor interfaces; Peierls distortion; scanning tunneling microscopy (STM); silicon; surface electronic phenomena;
D O I
10.1016/S0039-6028(97)00014-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Initial growth of In on Si(100)2x1 was studied by scanning tunneling microscopy at room and liquid nitrogen temperatures. Indium atoms are found to nucleate preferably around S-B steps and grow into one-dimensional ad-dimer chains. The individual In atoms within an ad-dimer are resolved for the first time through two maxima(Angstrom 3 A apart) for each oblong protrusion in the empty states. Furthermore, the orientation of the ad-dimer is evidently along the chain direction, thereby justifying the parallel ad-dimer model. We also probe the electronic nature of In ad-dimer chains through the I-V characteristics, which shows the existence of a surface-state bandgap (similar to 1.5 eV). The semiconducting property so implied and the ad-dimer chain structure are further rationalized by the Peierls pairing mechanism, that is, the half-filling of the In p-band leads to an electron-phonon coupling that animates the dimerization and opens up a gap just at the Fermi level.
引用
收藏
页码:23 / 30
页数:8
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