SURFACE-STRUCTURES OF SI(100)-AL PHASES

被引：61

作者：

IDE, T

NISHIMORI, T

ICHINOKAWA, T

机构：

来源：

SURFACE SCIENCE | 1989年 / 209卷 / 03期

关键词：

D O I：

10.1016/0039-6028(89)90079-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：335 / 344

页数：10

共 21 条

[1] RHEED OBSERVATION OF THE SI(111)(SQUARE-ROOT-31XSQUARE-ROOT-31)R+ -9-DEGREES-IN STRUCTURE [J].

AIYAMA, T ;

INO, S .

SURFACE SCIENCE, 1979, 82 (02) :L585-L588

[2] ROOM-TEMPERATURE ADSORPTION AND GROWTH OF GA AND IN ON CLEAVED SI(111) [J].

BOLMONT, D ;

CHEN, P ;

SEBENNE, CA ;

PROIX, F .

SURFACE SCIENCE, 1984, 137 (01) :280-292

[3]

BOLMONT D, 1984, J PHYSIQUE C, V5, P419

[4] ADSORPTION OF AL ON CLEAVED SI(111) AT ROOM-TEMPERATURE [J].

CHEN, P ;

BOLMONT, D ;

SEBENNE, CA .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (27) :4897-4905

[5] ELECTRONIC AND ATOMIC-STRUCTURE OF SI(111) AL, AG, AND NI METAL OVERLAYER INDUCED SURFACE RECONSTRUCTIONS [J].

HANSSON, GV ;

BACHRACH, RZ ;

BAUER, RS ;

CHIARADIA, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02) :550-555

[6] NEW MODELS FOR METAL-INDUCED RECONSTRUCTIONS ON SI(111) [J].

HANSSON, GV ;

BACHRACH, RZ ;

BAUER, RS ;

CHIARADIA, P .

PHYSICAL REVIEW LETTERS, 1981, 46 (15) :1033-1037

[7] ELECTRONIC-STRUCTURE OF SI(111) SURFACES WITH GROUP III AD-ATOMS [J].

HANSSON, GV ;

NICHOLLS, JM ;

MARTENSSON, P ;

UHRBERG, RIG .

SURFACE SCIENCE, 1986, 168 (1-3) :105-113

[8] RECONSTRUCTION OF ALUMINUM AND INDIUM OVERLAYERS ON SI(111) - A SYSTEMATIC STUDY WITH HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION [J].

KELLY, MK ;

MARGARITONDO, G ;

ANDERSON, J ;

FRANKEL, DJ ;

LAPEYRE, GJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1396-1399

[9] ANGLE-RESOLVED ULTRAVIOLET-PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AL SURFACE [J].

SAGAWA, T ;

KINOSHITA, T ;

KONO, S .

PHYSICAL REVIEW B, 1985, 32 (04) :2714-2716

[10] COMPARATIVE-STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-GA AND SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AL SURFACES BY ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON-SPECTROSCOPY [J].

KINOSHITA, T ;

KONO, S ;

SAGAWA, T .

SOLID STATE COMMUNICATIONS, 1985, 56 (08) :681-685

← 1 2 3 →