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Scanning squid microscopy

被引：132
作者：
Kirtley, JR [1 ]
Wikswo, JP
机构：
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
来源：
ANNUAL REVIEW OF MATERIALS SCIENCE | 1999年 / 29卷
关键词：
magnetic; inspection; superconductivity; defects; corrosion;
D O I：
10.1146/annurev.matsci.29.1.117
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The scanning SQUID microscope (SSM) is a powerful tool for imaging magnetic fields above sample surfaces. It has the advantage of high sensitivity;md bandwidth and the disadvantages of relatively modest spatial resolution and the requirement of a cooled SQUID sensor. We describe the various implementations of this type of instrument and discuss a number of applications, including magnetic imaging of short circuits in integrated circuits, corrosion currents in aluminum, and trapped flux in superconductors.
引用
收藏
页码：117 / 148
页数：32
相关论文
共 98 条
[1]  
ANDERBERG J, 1994, B AM PHYS SOC, V39, P196
[2]  
BAUDENBACHER F, 1999, UNPUB REV SCI INSTRM
[3]   RECONSTRUCTION OF THE MAGNETIZATION IN A THIN-FILM BY A COMBINATION OF LORENTZ MICROSCOPY AND EXTERNAL-FIELD MEASUREMENTS [J].
BEARDSLEY, IA .
IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (01) :671-677
[4]   DETECTION OF MAGNETIC-FIELDS GENERATED BY ELECTROCHEMICAL CORROSION [J].
BELLINGHAM, JG ;
MACVICAR, MLA ;
NISENOFF, M ;
SEARSON, PC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) :1753-1754
[5]   SQUID TECHNOLOGY APPLIED TO THE STUDY OF ELECTROCHEMICAL CORROSION [J].
BELLINGHAM, JG ;
MACVICAR, MLA ;
NISENOFF, M .
IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (02) :477-479
[6]   MAGNETIC FLUX-LINE LATTICES AND VORTICES IN THE COPPER-OXIDE SUPERCONDUCTORS [J].
BISHOP, DJ ;
GAMMEL, PL ;
HUSE, DA ;
MURRAY, CA .
SCIENCE, 1992, 255 (5041) :165-172
[7]   IMAGING RADIOFREQUENCY FIELDS USING A SCANNING SQUID MICROSCOPE [J].
BLACK, RC ;
WELLSTOOD, FC ;
DANTSKER, E ;
MIKLICH, AH ;
KOELLE, D ;
LUDWIG, F ;
CLARKE, J .
APPLIED PHYSICS LETTERS, 1995, 66 (10) :1267-1269
[8]   EDDY-CURRENT MICROSCOPY USING A 77-K SUPERCONDUCTING SENSOR [J].
BLACK, RC ;
WELLSTOOD, FC ;
DANTSKER, E ;
MIKLICH, AH ;
KINGSTON, JJ ;
NEMETH, DT ;
CLARKE, J .
APPLIED PHYSICS LETTERS, 1994, 64 (01) :100-102
[9]   HIGH-FREQUENCY MAGNETIC MICROSCOPY USING A HIGH-T-C SQUID [J].
BLACK, RC ;
WELLSTOOD, FC ;
DANTSKER, E ;
MIKLICH, AH ;
KOELLE, D ;
LUDWIG, F ;
CLARKE, J .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1995, 5 (02) :2137-2141
[10]   MAGNETIC MICROSCOPY USING A LIQUID-NITROGEN COOLED YBA2CU3O7 SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE [J].
BLACK, RC ;
MATHAI, A ;
WELLSTOOD, FC ;
DANTSKER, E ;
MIKLICH, AH ;
NEMETH, DT ;
KINGSTON, JJ ;
CLARKE, J .
APPLIED PHYSICS LETTERS, 1993, 62 (17) :2128-2130
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