Scanning squid microscopy

被引:132
作者
Kirtley, JR [1 ]
Wikswo, JP
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
来源
ANNUAL REVIEW OF MATERIALS SCIENCE | 1999年 / 29卷
关键词
magnetic; inspection; superconductivity; defects; corrosion;
D O I
10.1146/annurev.matsci.29.1.117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The scanning SQUID microscope (SSM) is a powerful tool for imaging magnetic fields above sample surfaces. It has the advantage of high sensitivity;md bandwidth and the disadvantages of relatively modest spatial resolution and the requirement of a cooled SQUID sensor. We describe the various implementations of this type of instrument and discuss a number of applications, including magnetic imaging of short circuits in integrated circuits, corrosion currents in aluminum, and trapped flux in superconductors.
引用
收藏
页码:117 / 148
页数:32
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