Ab initio study of deep defect states in narrow band-gap semiconductors:: Group III impurities in PbTe

被引:133
作者
Ahmad, S [1 ]
Hoang, K [1 ]
Mahanti, SD [1 ]
机构
[1] Michigan State Univ, Dept Phys & Astron, E Lansing, MI 48824 USA
关键词
D O I
10.1103/PhysRevLett.96.056403
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The nature of deep defect states, in general, and those associated with group III elements (Ga, In, Tl) in narrow band-gap IV-VI semiconductors (PbTe and PbSe), in particular, have been of great interest over the past three decades. We present ab initio electronic structure calculations that give a new picture of these states compared to the currently accepted model in terms of a negative-U Hubbard model. The Fermi surface pinning and why In-doped PbTe and related compounds show excellent high temperature thermoelectric behavior can be understood within the new picture.
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页数:4
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