Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits

被引：71

作者：

Fedi, G ^{[1
]}

Manetti, S

Piccirilli, MC

Starzyk, J

机构：

[1] Univ Florence, Dept Elect Engn, I-50139 Florence, Italy

[2] Ohio Univ, Sch Elect Engn & Comp Sci, Athens, OH 45701 USA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS | 1999年 / 46卷 / 07期

关键词：

analog system fault diagnosis; analog system testing; fault location;

D O I：

10.1109/81.774222

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept, New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques.

引用

页码：779 / 787

页数：9

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