Molecular resolution imaging of C60 on Au(111) by non-contact atomic force microscopy

被引：23

作者：

Mativetsky, JM ^{[1
]}

Burke, SA ^{[1
]}

Hoffmann, R ^{[1
]}

Sun, Y ^{[1
]}

Grutter, P ^{[1
]}

机构：

[1] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

来源：

NANOTECHNOLOGY | 2004年 / 15卷 / 02期

关键词：

D O I：

10.1088/0957-4484/15/2/009

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Non-contact atomic force microscopy (NC-AFM) was used to study thin films of C-60 on Au(111). After observing the Au(111) 23 x root3 reconstruction, 2-3 monolayers Of C60 were deposited onto the An surface. The close-packed C-60 surface was imaged by NC-AFM with molecular resolution. Enhanced corrugation and a stretching of the C-60 lattice were observed at step edges. Based on a calculation of the force required to displace an edge molecule, it is proposed that the edge effects are a result of tip-induced displacements of edge molecules. While imaging small clusters of C-60, some molecules were removed, leading to structural rearrangements of the clusters.

引用

页码：S40 / S43

页数：4

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