Application of piezoresistive Wheatstone bridge cantilever in advanced atomic force microscopy techniques

The paper presents an application of the Wheatstone piezoresistive bridge in advanced AFM investigations. We have utilized this cantilever in investigations of the contact and noncontact modes, and in investigations of lateral forces and modulation load force microscopy. In the case of non-homogeneous surfaces, investigations of various surface parameters and topography observations are very important. Such surfaces are used in most industrial applications, and investigations of their properties at the nanometre scale is of great interest.