A high resolution silicon beam telescope

被引：21

作者：

Amsler, C ^{[1
]}

Bösiger, K ^{[1
]}

Glättli, M ^{[1
]}

Kaufmann, R ^{[1
]}

Ould-Saada, F ^{[1
]}

Regenfus, C ^{[1
]}

Riedler, P ^{[1
]}

Spanier, S ^{[1
]}

机构：

[1] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2002年 / 480卷 / 2-3期

关键词：

silicon; microstrips; position resolution;

D O I：

10.1016/S0168-9002(01)01241-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe the design and present the performances of a charged particle telescope used for high resolution silicon pixel developments, A telescope made of four x and four y single-sided silicon microstrip layers was built, providing an r.m.s. position resolution of 1 mum for high energy charged particles. A signal over noise ratio of 130 was achieved with minimum ionizing particles. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：501 / 507

页数：7

共 13 条

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