A submicron precision silicon telescope for beam test purposes

被引：47

作者：

Colledani, C

Dulinski, W

Turchetta, R

Djama, F

Rudge, A

Weilhammer, P

机构：

[1] ULP,CRN,IN2P3,CNRS,F-67037 STRASBOURG,FRANCE

[2] ULP,LEPSI,IN2P3,CNRS,F-67037 STRASBOURG,FRANCE

[3] CERN,CH-1211 GENEVA 23,SWITZERLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1996年 / 372卷 / 03期

关键词：

D O I：

10.1016/0168-9002(95)01414-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A precise and compact silicon microstrip detector telescope designed to provide reference information for charged particle tracks has been constructed. First operation results are presented. A signal over noise ratio higher than 100 has been obtained, resulting in a spatial resolution of 1.4 mu m per detector, for a readout pitch of 50 mu m. At a position in the center of the telescope, a track extrapolation error of 0.7 mu m can be obtained fur reconstructed tracks.

引用

页码：379 / 384

页数：6

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