MEASUREMENT OF SPATIAL-RESOLUTION OF A DOUBLE-SIDED AC-COUPLED MICROSTRIP DETECTOR

被引：12

作者：

HUBBELING, L

TURALA, M

WEILHAMMER, P

BRENNER, R

HIETANEN, I

LINDGREN, J

TUUVA, T

DULINSKI, W

HUSSON, D

LOUNIS, A

SCHAEFFER, M

TURCHETTA, R

CHAUVEAU, J

AVSET, BS

EVENSEN, L

机构：

[1] UNIV HELSINKI,SF-00100 HELSINKI 10,FINLAND

[2] UNIV STRASBOURG 1,LEPSI,IN2P3,F-67070 STRASBOURG,FRANCE

[3] LPNHE,PARIS 6,FRANCE

[4] SI,OSLO,NORWAY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 310卷 / 1-2期

关键词：

D O I：

10.1016/0168-9002(91)91025-Q

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Capacitively coupled Si strip detectors with readout on both the p-side and the n-side have been developed. A novel scheme to separate strips ohmically on the n-side by means of field depletion via a suitable potential applied to the readout strips has been successfully demonstrated. Results on the spatial resolution of these detectors for both sides measured in a high energy beam are presented. The spatial resolution of the n-side has been measured at different incident angles of the beam tracks with respect to a vertical plane through the n+ strips at 0-degrees, 20-degrees and 40-degrees.

引用

页码：197 / 202

页数：6

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