The effect of excess bismuth on the ferroelectric properties of SrBi2Ta2O9 thin films

被引:90
作者
Chen, TC [1 ]
Li, TK [1 ]
Zhang, XB [1 ]
Desu, SB [1 ]
机构
[1] VIRGINIA POLYTECH INST & STATE UNIV,DEPT MAT SCI & ENGN,BLACKSBURG,VA 24061
关键词
D O I
10.1557/JMR.1997.0215
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of excess bismuth on the ferroelectric properties of SrBi2Ta2O9 (SBT) thin films having a perovskite-like layered structure was investigated for excess bismuth contents ranging from 0% to 100%. For the first time, a limited solid solution of SBT and Bi2O3 was shown to exist when the amount of excess Bi was less than 50%. The formation of a solid solution enhanced the grain size and a-b plane orientation of the films, resulting in substantial improvement in the ferroelectric hysteresis properties of the films. On the other hand, when the amount of excess Bi exceeded 50%, Bi2O3 appeared as a second phase which led to high leakage current and poor ferroelectric hysteresis curves. 30-50% excess Bi content was found to be the optimum composition with respect to grain size, crystallographic orientation, and single phase formation. Within this range, SBT films exhibit low leakage current density (similar to 10(-9) A/cm(2)) and maximum remanent polarization (2Pr similar to 12 mu C/cm(2)).
引用
收藏
页码:1569 / 1575
页数:7
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