X-ray microprobes

被引：27

作者：

Chevallier, P

Dhez, P

Erko, A

Firsov, A

Legrand, F

Populus, P

机构：

[1] UNIV PARIS 06,LPAN,F-75252 PARIS,FRANCE

[2] UNIV PARIS 11,LSAI,F-91405 ORSAY,FRANCE

[3] RAS,IMT,LAB XRAY OPT & TECHNOL,CHERNOGOLOVKA,MOSCOW,RUSSIA

[4] CEA BRUYERES CHATEL,F-91680 BRUYERES CHATEL,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1996年 / 113卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(95)01314-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The advent of synchrotron radiation and the recent development of X-ray optics have rendered possible the realization of X-ray fluorescence microprobes. Various arrangements allow to obtain micrometer size hard X-ray beams with enough flux to undertake elemental mapping of trace elements. Associated with microdiffraction or with extended X-ray absorption fine structure studies, these microprobes will become a very interesting tool for material characterization.

引用

页码：122 / 127

页数：6

共 22 条

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