共 35 条
- [2] [Anonymous], 1980, Engineering applications of correlation and spectral analysis
- [6] Materials' properties measurements: Choosing the optimal scanning probe microscope configuration [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1308 - 1312
- [7] SCAN SPEED LIMIT IN ATOMIC FORCE MICROSCOPY [J]. JOURNAL OF MICROSCOPY-OXFORD, 1993, 169 : 75 - 84
- [9] Transient response of tapping scanning force microscopy in liquids [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1313 - 1317