Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution

被引：55

作者：

Rippard, WH ^{[1
]}

Buhrman, RA ^{[1
]}

机构：

[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 07期

关键词：

D O I：

10.1063/1.124578

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A variation of ballistic electron emission microscopy has been developed to image magnetic structure in thin-film multilayers with nanometer resolution. In studies of nominally uncoupled Co/Cu/Co trilayer films, magnetic domains and domain-wall motion are readily observable with this technique. In the Co/Cu/Co trilayer system magnetic domains are found to occur on an similar to 500-nm-length scale and less, while smaller-scale fluctuations in the ballistic electron transport properties of the system are found on an similar to 10 nm length scale. (C) 1999 American Institute of Physics. [S0003-6951(99)03933-9].

引用

页码：1001 / 1003

页数：3

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