HYDROGEN-TERMINATED SILICON SUBSTRATES FOR LOW-TEMPERATURE MOLECULAR-BEAM EPITAXY

被引：91

作者：

GRUNTHANER, PJ

GRUNTHANER, FJ

FATHAUER, RW

LIN, TL

HECHT, MH

BELL, LD

KAISER, WJ

SCHOWENGERDT, FD

MAZUR, JH

机构：

[1] COLORADO SCH MINES,DEPT PHYS,GOLDEN,CO 80401

[2] UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90089

来源：

THIN SOLID FILMS | 1989年 / 183卷

关键词：

D O I：

10.1016/0040-6090(89)90445-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：197 / 212

页数：16

相关论文

共 25 条

[1] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[2] INFRARED-SPECTROSCOPY OF SI(111) SURFACES AFTER HF TREATMENT - HYDROGEN TERMINATION AND SURFACE-MORPHOLOGY
BURROWS, VA
CHABAL, YJ
HIGASHI, GS
RAGHAVACHARI, K
CHRISTMAN, SB
[J]. APPLIED PHYSICS LETTERS, 1988, 53 (11) : 998 - 1000
[3] INFRARED-SPECTROSCOPY OF SI(111) AND SI(100) SURFACES AFTER HF TREATMENT - HYDROGEN TERMINATION AND SURFACE-MORPHOLOGY
CHABAL, YJ
HIGASHI, GS
RAGHAVACHARI, K
BURROWS, VA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 2104 - 2109
[4] REAL-SPACE OBSERVATION OF PI-BONDED CHAINS AND SURFACE DISORDER ON SI(111)2X1
FEENSTRA, RM
THOMPSON, WA
FEIN, AP
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (06) : 608 - 611
[5] TUNNELING SPECTROSCOPY OF THE SI(111)2X1 SURFACE
FEENSTRA, RM
STROSCIO, JA
FEIN, AP
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 295 - 306
[6] FENNER DB, 1989, IN PRESS J APPL 0701
[7] GEORGE SM, 1989, CHEM PERSPECTIVES MI, V131, P169
[8] INVESTIGATIONS ON HYDROPHILIC AND HYDROPHOBIC SILICON (100) WAFER SURFACES BY X-RAY PHOTOELECTRON AND HIGH-RESOLUTION ELECTRON-ENERGY LOSS-SPECTROSCOPY
GRUNDNER, M
JACOB, H
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 39 (02): : 73 - 82
[9] GRUNDNER M, 1988, AIP C P, V167, P329
[10] THE LOCALIZATION AND CRYSTALLOGRAPHIC DEPENDENCE OF SI SUBOXIDE SPECIES AT THE SIO2/SI INTERFACE
GRUNTHANER, PJ
HECHT, MH
GRUNTHANER, FJ
JOHNSON, NM
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : 629 - 638