Highly ordered anisotropic nano-needles in para-sexiphenyl films

被引：17

作者：

Andreev, A ^{[1
]}

Sitter, H

Sariciftci, NS

Brabec, CJ

Springholz, G

Hinterdorfer, P

Plank, H

Resel, R

Thierry, A

Lotz, B

机构：

[1] Univ Linz, Linz Inst Organ Solar Cells, LIOS, A-4040 Linz, Austria

[2] Univ Linz, Inst Solid State Phys & Semicond, A-4040 Linz, Austria

[3] Univ Linz, Inst Biophys, A-4040 Linz, Austria

[4] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria

[5] Inst Charles Sadron, F-67083 Strasbourg, France

来源：

THIN SOLID FILMS | 2002年 / 403卷

关键词：

epitaxy; single crystalline thin films; oligomers; atomic force microscopy;

D O I：

10.1016/S0040-6090(01)01587-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atomic force microscopy (AFM) was used to investigate the early growth stage of highly ordered para-sexiphenyl thin films deposited by hot wall epitaxy on mica, in order to find the process controlling parameters. It was shown that the growth time and surface type are important parameters for controlling of the film morphology, in terms of the degree of anisotropy and long range order. X-Ray diffraction pole figure technique and transmission electron diffraction was also used to characterize the crystallographic structure of the thicker films. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：444 / 448

页数：5

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