Detection of cadmium oxides on a CdTe substrate by X-AES

被引：14

作者：

DebiemmeChouvy, C

Marin, FI

Roll, U

Bujor, M

Etcheberry, A

机构：

[1] UNIV VERSAILLES,LAB ELECTROCHIM & CHIM SOLIDES INORGAN,F-78035 VERSAILLES,FRANCE

[2] PHYS ELECT GMBH,D-85737 ISMANING,GERMANY

来源：

SURFACE SCIENCE | 1996年 / 352卷

关键词：

cadmium telluride; oxidation; photoelectron spectroscopy; X-ray Auger electron spectroscopy;

D O I：

10.1016/0039-6028(95)01186-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The surface chemistry of CdTe was studied by XPS and X-AES, Interface modifications resulted from immersion in solutions containing either Ce4+ or Fe(CN)(6)(3-) ions. Reproducible surfaces are obtained that allow the study of Cd X-AES spectra for different surface chemical compositions.

引用

页码：495 / 498

页数：4

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